Description
Bent Palladium Alloy Probe Tips
125mil / 30um / 120° Box of 10
Set of 10 Bent Palladium Alloy Probe Tips, designed for high-precision semiconductor testing and micro-probing. Unlike standard tips, the Palladium Alloy construction offers superior contact resistance and is ideal for applications where oxidation must be minimized. These probes feature a 120-degree bend and a precision 30-micron (30um) tip radius, ensuring stable and accurate electrical contact.
Bent Palladium Probe, 30um Probe Tips, Palladium Alloy Needle, Semiconductor Test Probe, 120 Degree Bent Probe, Micro-probing Tips, 125mil Probe, Wafer Probing Needle, Precision Test Probe
BTU260105
USG

